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CC: Dennis Sanner , Jeff Finger , ApptechNZ , RossGMail , "ken@elecsyn.com" Sender: "piclist-bounces@mit.edu" Date: Wed, 11 Mar 2020 06:19:47 -0700 Subject: [EE]:: Potential early Solar Panel failure mechanism (polyamide backsheet failure) Thread-Topic: [EE]:: Potential early Solar Panel failure mechanism (polyamide backsheet failure) Thread-Index: AdX3qVQ1Rk0hj73vSeasEhIws96uzg== Message-ID: List-Help: List-Subscribe: , List-Unsubscribe: , Reply-To: Microcontroller discussion list - Public. Accept-Language: en-US X-MS-Exchange-Organization-AuthAs: Anonymous X-MS-Exchange-Organization-AuthSource: TS500.efplus4.local X-MS-Has-Attach: X-Auto-Response-Suppress: All X-MS-Exchange-Organization-SenderIdResult: Pass X-MS-Exchange-Organization-PRD: mit.edu X-MS-TNEF-Correlator: received-spf: Pass (protection.outlook.com: domain of gmail.com designates 209.85.208.51 as permitted sender) receiver=protection.outlook.com; client-ip=209.85.208.51; helo=mail-ed1-f51.google.com; dkim-signature: v=1; a=rsa-sha256; c=relaxed/relaxed; d=gmail.com; s=20161025; h=mime-version:from:date:message-id:subject:to:cc; bh=DybZVa68sZu5L7La1M/Q8FPXpjXyywB30yCK4WU6xLQ=; b=NA1b5YuWSr20FQ29hWgEqWPOfv90bbGTowXOxLsXzloRmTlnao9j7BGTx+mthKcc3K j4J/Vo7v678PSmVlQOXinAi8y8UQFkTj1e8okILTr24zkPyPEFel2946hasb4G8A8JZJ BSG+12+rEWGQYd37JzAl1MWIdkEcQSACAfPuXwMSu8Adh/IATtVRzOhjMQX/sArPXrPf s5NnQUK1WmTwNK+S80idFo6J+C8ZWxqjc1MJPVgxciHaWK8+L7EFAgHdnjdT9x9FYtBA ZCt+7KuTvUGTwPIG/2qpQ/QNlV+U4vddrsksk4ovotn4JEtUWioXIlGkieM2YtvJS7Od dEBA== authentication-results: spf=pass (sender IP is 209.85.208.51) smtp.mailfrom=gmail.com; mit.edu; dkim=pass (signature was verified) header.d=gmail.com;mit.edu; dmarc=pass action=none header.from=gmail.com;compauth=pass reason=100 errors-to: piclist-bounces@mit.edu list-id: "Microcontroller discussion list - Public." list-post: x-beenthere: piclist@mit.edu x-mailman-version: 2.1.6 x-received: by 2002:aa7:c7cd:: with SMTP id o13mr2926576eds.138.1583932831588; Wed, 11 Mar 2020 06:20:31 -0700 (PDT) x-topics: [EE] x-content-filtered-by: Mailman/MimeDel 2.1.6 Content-Type: text/plain; charset="us-ascii" Content-Transfer-Encoding: quoted-printable MIME-Version: 1.0 This page describes a NIST investigation into early failures of some industry standard Aluminum - EVA - Silicon - backsheet. What is eing seen is that polyamide backsheets are cracking along the cell boundaries after a few years. This is of likely interest to PV panel users as the failure mechanism is obvious in retrospect, points to bad material quality, & may be able to be mitigated What appears to be happening is that UV reakdown of the EVA encapsulant is producing reaction products which migrate between the individual PV cells and attak the polyamide backsheets. Quality conscious manufacturers have long been aware of EVA degradation. Some glass frontsheets have reaction product scavengers and 'all EVAs are not created equal". The fact that some (many) panels have backsheet lifetimes in excess of 30 years indicates that corners may consciously be being cut. My comment only: Owners of panels not covered by warranties, where these failures are starting to appear may be able to retrofit alternative backsheets over the existing ones before secondary damage occurs. https://www.nist.gov/news-events/news/2020/03/nist-study-uncovers-potential= -driver-premature-solar-panel-failures Russell --=20 http://www.piclist.com/techref/piclist PIC/SX FAQ & list archive View/change your membership options at http://mailman.mit.edu/mailman/listinfo/piclist .