I would think both are true. If the span between min and max is 5 Std Dev wide, then both scenarios would be true, no? I don't think it would be flat without extra testing and sorting to weed out the outliers. I would think that the bulk of devices would be at the center of the bell curve, plus or minus 1 Std. Dev. Which is the basic definition of the bell curve concept. Regards, Jim > -------- Original Message -------- > Subject: [EE] transistor gain variations > From: David Van Horn > Date: Thu, March 14, 2019 7:31 am > To: "Microcontroller discussion list - Public." >=20 >=20 > Does anyone know if transistor gain variations for the same part, unit to= unit, are distributed flat across the min-max or gaussian? >=20 > -- > David VanHorn > Lead Hardware Engineer >=20 > Backcountry Access, Inc. > 2820 Wilderness Pl, Unit H > Boulder, CO 80301 USA > phone: 303-417-1345 x110 > email: david.vanhorn@backcountryaccess.com >=20 > --=20 > http://www.piclist.com/techref/piclist PIC/SX FAQ & list archive > View/change your membership options at > http://mailman.mit.edu/mailman/listinfo/piclist --=20 http://www.piclist.com/techref/piclist PIC/SX FAQ & list archive View/change your membership options at http://mailman.mit.edu/mailman/listinfo/piclist .