Frankly, I don't know. But I would suspect the answer is "neither." Effects of the manufacturing process are most likely to be Gaussian. But so many things these days are tested and "binned" (sorted by various specifications) during production for various reasons. Sorting processes in general wreak havoc on statistical behaviors. :-) A few years ago I was looking at some data that had a noticeable "double peak." After more digging than I care to admit, I found out that the parts were being sorted before I got them - the ones that tested near nominal spec were being sold to someone else. -Denny On Thu, Mar 14, 2019 at 5:36 AM David Van Horn < david.vanhorn@backcountryaccess.com> wrote: > Does anyone know if transistor gain variations for the same part, unit to > unit, are distributed flat across the min-max or gaussian? > > -- > David VanHorn > Lead Hardware Engineer > > Backcountry Access, Inc. > 2820 Wilderness Pl, Unit H > Boulder, CO 80301 USA > phone: 303-417-1345 x110 > email: david.vanhorn@backcountryaccess.com david.vanhorn@backcountryaccess.com> > > -- > http://www.piclist.com/techref/piclist PIC/SX FAQ & list archive > View/change your membership options at > http://mailman.mit.edu/mailman/listinfo/piclist > --=20 http://www.piclist.com/techref/piclist PIC/SX FAQ & list archive View/change your membership options at http://mailman.mit.edu/mailman/listinfo/piclist .