William Bross wrote:
> Wouldn't any breach of any of the isolation
> barriers throw the measured current for each section off?

Not necessarily.  Insulation breakdown is non-linear.  If some dirt or a
solder blob ended up partly bridging the isolation barrier, it would still
work fine at low voltage, then suddenly conduct at high voltage.  That's why
you test at higher than expected voltage.

> We'll wait for the ruling by the authorities.

It seems to me you should want to do the hi-pot test for your own purposes
anyway.  If you claim a certain level of isolation, you really should test
for it.  I don't understand the objection.  2 seconds of additional test
time seems cheap compared to just one field failure, and I don't see how
else you can guarantee the spec is met.


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