William ChopsWestfield wrote:

> On Oct 20, 2006, at 2:27 PM, Jinx wrote:
> 
>> Given that every PIC seems to have teething troubles, after all these
>> years you'd think that the silicon designers might look closely at
>> modifications they make to modules 
>> 
>> Logically it sounds simple, maybe in practice it's not
> 
> Heh.  Testing, and especially test design, is HARD.

OTOH, one would think that they have a pretty good test suite by now, after
so many devices. Many peripherals are similar or identical between devices,
so there's a lot of tests that can be shared or used slightly modified. 

Gerhard

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