>-----Original Message-----
>From: piclist-bounces@mit.edu [mailto:piclist-bounces@mit.edu] 
>Sent: 26 May 2005 13:36
>To: Microcontroller discussion list - Public.
>Subject: Re: [EE]:Maxim truck hijacked
>
>
>Jan-Erik Soderholm wrote:
>> I can't see why this would be any different from producing 
>just about 
>> anything. Statistical inspection was developed during WW-II when the 
>> US military found out that they didn't had the resources 
>(mostly time) 
>> to test and inspect *every* bomb made.
>
>Besides, how does one do complete functional testing of things 
>like bombs and fuses?  BOOOM - 397 good 7 bad.  BOOOM - 398 
>good 7 bad.  Pffft - 398 good 8 bad....

Coffee meets keyboard....

Olin, you've come out with some gems recently ;)

Regards

Mike

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