> > I do not know about the assertion that the chips with a bug are > > useless. These are very complex devices and many times can not be > > completely debugged till thousands of customers are looking at them My thoughts would be, without trying to attract "well, how many chips have YOU made lately ?" comments - o what sort of facilities do they have for (accelerated) testing and routines and scenarios to test every function and feature of the silicon ? o how does a silicon bug come about in the first place ? Are there not manufacturing templates for the various modules ? -- http://www.piclist.com PIC/SX FAQ & list archive View/change your membership options at http://mailman.mit.edu/mailman/listinfo/piclist