Hi Tal, We have a UL contact. I asked some questions and he is helpful in giving general answers but for technical questions he recommends us enroll into their 1-2 days orientation program which will cost thousands of dollars plus traveling expenses. Since you have experience on UL1998, I want to ask you where you get detailed information on the Table A2.1 an on the techniques on A7.1. After reading the Standard and conducting search on the Internet many times I still don't know what most of the required techniques are. The UL contact says the information is available only at their orientation program. Did you go to the program? If not how do you know how to do a -- let say, "data redundancy (A7.1.4) -- technique? Thanks, Tony Pan ----- Original Message ----- From: "Tal Dayan" To: Sent: Tuesday, May 07, 2002 10:42 AM Subject: Re: [PIC]: What is Testing Pattern for input > My suggestion to you is to contact UL and talk with one of their experts > that > performs this kind of tests. > > We were in similar situation few months ago and found the (specific) sales > person and > engineer very understanding and helpful. > > If you don't have UL in your area, try to talk with the certification body > that > will eventually will test and certify your product. The closer you get to > the person > that will actually test your equipment, the more accurate interpretation you > will have. > > Tal > > > -----Original Message----- > > From: pic microcontroller discussion list > > [mailto:PICLIST@MITVMA.MIT.EDU]On Behalf Of Tony Pan > > Sent: Monday, May 06, 2002 10:16 AM > > To: PICLIST@MITVMA.MIT.EDU > > Subject: [PIC]: What is Testing Pattern for input > > > > > > Hi, > > > > The software that I write needs to comply with the UL1998 Standard. The > > Standard requires us do a "testing pattern for input" to migitate > > microelectronic input failure. The definition for "testing pattern" as as > > the following: > > > > Testing pattern denotes a fault/error control technique used for periodic > > testing of input units, output units and interfaces of the control. A test > > pattern is introduced to the unit and the results are compared to expected > > values. Mutually independent means for introducing the test pattern and > > evaluating the results are used. The test pattern is constructed so as not > > to influence the correct operation of the control. > > > > After reading this, I still don't understand what it is. Can > > someone explain > > to me this technique (or techniques)? > > > > Thank you! > > > > Tony Pan > > > > -- > > http://www.piclist.com hint: To leave the PICList > > mailto:piclist-unsubscribe-request@mitvma.mit.edu > > > > > > -- > http://www.piclist.com hint: PICList Posts must start with ONE topic: > [PIC]:,[SX]:,[AVR]: ->uP ONLY! [EE]:,[OT]: ->Other [BUY]:,[AD]: ->Ads > > > -- http://www.piclist.com hint: PICList Posts must start with ONE topic: [PIC]:,[SX]:,[AVR]: ->uP ONLY! [EE]:,[OT]: ->Other [BUY]:,[AD]: ->Ads