Has anyone seen or heard of bytes in the EEPROM and/or FLASH becoming
corrupted over time?

We have seen a couple of units with corrupted E^2 and a couple with
corrupted FLASH.  Both of these are programmed using the EECON interface
with Vdd of 3.3V (Vmin is listed as 2.0V for the LF part).

Thanks.


Erik Reikes
Senior Software Engineer
Xsilogy, Inc.

ereikes@xsilogy.com
ph : (858) 362-5003
fax : (858) 362-1367
cell : (858) 663-1206

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